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Topics of Reliabilities - One-Shot Device Testing

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Publicado em Fri Mar 20 09:54:32 GMT-03:00 2015
Responsáveis:  Gustavo Blengini Faria
Palestrantes:  N. Balakrishnan
Grupo:  CeMEAI

Resume: Short-Course - Day 1: In this topic, I will explain the testing for one-shot devices which produces only either right or left censored data. I will then consider different lifetime distributions and explain the likelihood inference for data obtained from such one-shot device testing.

http://www.icmc.usp.br/e/df257